Thin-film dc SQUID gradiometer using a single YBa2Cu 3O7-x layer

Applied Physics Letters

Volumn 65, Issue 6, 1994, Pages 779-780

  Zakosarenko, V ^a   Schmidl, F ^a   Schneidewind, H ^a   Dorrer L ^a   Seidel, P ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

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EID: 21544445910     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.112228     Document Type: Article

References (13)