Fatigue and retention in ferroelectric Y-Ba-Cu-O/Pb-Zr-Ti-O/Y-Ba-Cu-O heterostructures

Applied Physics Letters

Volumn 61, Issue 13, 1992, Pages 1537-1539

  Ramesh, R ^a   Chan, W K ^a   Wilkens, B ^a   Gilchrist, H ^a   Sands, T ^a   Tarascon, J M ^a   Keramidas, V G ^a   Fork, D K ^b   Lee, J ^c   Safari, A ^c  

^a TELCORDIA TECHNOLOGIES   (United States)

^b PALO ALTO RESEARCH CENTER   (United States)

^c RUTGERS UNIVERSITY   (United States)

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Indexed keywords

EID: 21544439412     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.107488     Document Type: Article

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