Combined shear force and near-field scanning optical microscopy

Applied Physics Letters

Volumn 60, Issue 20, 1992, Pages 2484-2486

  Betzig, E ^a   Finn, P L ^a   Weiner, J S ^a  

^a LUCENT TECHNOLOGIES   (United States)

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Indexed keywords

EID: 21544436741     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.106940     Document Type: Article

References (17)