Formal validation and verification of atomic resolution microscope control and topography

Cybernetics and Systems

Volumn 32, Issue 8, 2001, Pages 851-870

  Nicolás, Joaquín ^a   Toval, Ambrosio ^a   Arenas, Aurelio ^a   Alcalde, Juan ^a  

^a University of Almeríoa   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544431902     PISSN: 01969722     EISSN: 10876553     Source Type: Journal    
DOI: 10.1080/019697201753229836     Document Type: Article

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