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Volumn 97, Issue 8, 2005, Pages
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Optical lifting force under focused evanescent wave illumination: A ray optics model
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Author keywords
[No Author keywords available]
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Indexed keywords
NUMERICAL APERTURE (NA);
OPTICAL LIFTING FORCE;
RAY OPTICS MODEL;
TOTAL INTERNAL REFLECTION;
DIELECTRIC MATERIALS;
DYNAMICS;
LIGHT REFLECTION;
PARTICLE SIZE ANALYSIS;
REFRACTIVE INDEX;
RAY TRACING;
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EID: 21444460283
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1863453 Document Type: Review |
Times cited : (10)
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References (13)
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