Fault diagnosis in HVAC chillers using data-driven techniques

AUTOTESTCON (Proceedings)

Volumn , Issue , 2004, Pages 407-413

  Choi, Kihoon ^a   Namburu, Madhavi ^a   Azam, Mohammad ^a   Luo, Jianhui ^a   Pattipati, Krishna ^a   Patterson Hine, Ann ^b  

^a University of Connecticut   (United States)

^b NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSTIC PROCESS; FAULT DETECTION AND ISOLATION (FDI); KNOWLEDGE BASES; SUPPORT VECTOR MACHINES (SVM);

AIR CONDITIONING; DATA ACQUISITION; DEGRADATION; ENERGY EFFICIENCY; HEATING; QUALITY OF SERVICE; VENTILATION; WEAR OF MATERIALS;

ELECTRIC POWER SYSTEMS;

EID: 21444435979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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