Uncertainty Analysis of Memory Based Sensor Validation Techniques

Real-Time Systems

Volumn 27, Issue 1, 2004, Pages 7-26

  Gribok, Andrei V ^a   Urmanov, Aleksey M ^b   Hines, J Wesley ^a  

^a University of Tennessee   (United States)

^b SUN MICROSYSTEMS   (United States)

Author keywords

Fault diagnostics; Kernel regression; Regularization; Sensor validation; Uncertainty

Indexed keywords

ALGORITHMS; BACKPROPAGATION; DATA STORAGE EQUIPMENT; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; MONITORING; NUCLEAR POWER PLANTS; NUCLEAR REACTORS; REGRESSION ANALYSIS; STATISTICAL METHODS; UNCERTAIN SYSTEMS;

FAULT DIAGNOSTICS; KERNEL REGRESSION; REGULARIZATION; SENSOR VALIDATION; UNCERTAINTY;

SENSORS;

EID: 2142806741     PISSN: 09226443     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:TIME.0000019124.24404.e9     Document Type: Conference Paper

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