Stark widths of faint Si II lines

Astronomy and Astrophysics

Volumn 418, Issue 2, 2004, Pages 765-769

  Lesage, A ^a   Redon, R ^b  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b UNIVERSITÉ DE TOULON   (France)

Author keywords

Atomic data; Line: profiles; Plasmas; Stars: atmospheres

Indexed keywords

CARRIER CONCENTRATION; EARTH ATMOSPHERE; LINE CONCENTRATORS; PLASMAS; PROFILOMETRY; SHOCK TUBES; SIGNAL FILTERING AND PREDICTION; SILICON COMPOUNDS;

ATOMIC DATA; LINE PROFILES; STARK EFFECT; STARK WIDTH;

ASTROPHYSICS;

EID: 2142795874     PISSN: 00046361     EISSN: None     Source Type: Journal    
DOI: 10.1051/0004-6361:20035585     Document Type: Article

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