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Volumn 455-456, Issue , 2004, Pages 417-421
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Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings
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Author keywords
Sol gel method; Spectroscopic ellipsometry; Thin coatings; TiO2 CuO
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Indexed keywords
COPPER OXIDES;
ELLIPSOMETRY;
HEAT TREATMENT;
ION BEAMS;
PHASE TRANSITIONS;
POROSITY;
RAMAN SPECTROSCOPY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SOL-GELS;
SYNTHESIS (CHEMICAL);
TITANIUM DIOXIDE;
OXIDATIVE CONDITIONS;
SPECTROSCOPIC ELLIPSOMETRY;
THIN COATINGS;
TIO2-CUO;
THIN FILMS;
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EID: 2142750983
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.01.030 Document Type: Conference Paper |
Times cited : (22)
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References (19)
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