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Volumn 455-456, Issue , 2004, Pages 417-421

Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings

Author keywords

Sol gel method; Spectroscopic ellipsometry; Thin coatings; TiO2 CuO

Indexed keywords

COPPER OXIDES; ELLIPSOMETRY; HEAT TREATMENT; ION BEAMS; PHASE TRANSITIONS; POROSITY; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SYNTHESIS (CHEMICAL); TITANIUM DIOXIDE;

EID: 2142750983     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.030     Document Type: Conference Paper
Times cited : (22)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.