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Volumn 523, Issue 3, 2004, Pages 323-333
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Influence of the film deposition rate and humidity on the properties of thin CsI photocathodes
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Author keywords
Atomic force microscopy; Crystalline structure; CsI photocathodes; Defect diffusion; Evaporation rate; Humid air exposure; Optical properties; Surface morphology
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Indexed keywords
ATMOSPHERIC HUMIDITY;
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
DEPOSITION;
DIFFUSION;
EVAPORATION;
MORPHOLOGY;
PHOTOCATHODES;
PHOTOEMISSION;
CRYSTALLINE STRUCTURE;
CSI PHOTOCATHODES;
DEFECT DIFFUSION;
EVAPORATION RATE;
HUMID-AIR EXPOSURE;
CESIUM COMPOUNDS;
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EID: 2142728631
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2003.12.015 Document Type: Article |
Times cited : (24)
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References (11)
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