Tunneling resonances in structures with a two-step barrier

JETP Letters

Volumn 67, Issue 10, 1998, Pages 863-868

  Khanin, Yu N ^a   Vdovin, E E ^a   Dubrovskii Yu V ^a   Novoselov, K S ^a   Andersson, T G ^b  

^a INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2142720265     PISSN: 00213640     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.567762     Document Type: Article

References (9)

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