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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 4 B, 2002, Pages 2724-2726

Electron spectroscopy of C60 thin film fet structures

(2) Shimada, Toshihiro a Koma, Atsushi a

Author keywords

Electron energy loss spectroscopy; Field effect transistor; Fullerene; Polymerization; Ultraviolet photoelectron spectroscopy

Indexed keywords

BOUNDARY CONDITIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; FIELD EFFECT TRANSISTORS; PHOTOELECTRON SPECTROSCOPY; POLYMERIZATION; THIN FILMS; ULTRAVIOLET RADIATION;

MOLECULAR PLASMON; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; VACUUM ULTRAVIOLET IRRADIATION;

FULLERENES;

EID: 2142646657 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.41.2724 Document Type: Article

Times cited : (14)

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