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Volumn 70, Issue 1, 1994, Pages 63-73

Lattice relaxation around non-basal plane stacking defects in 2H martensite

Author keywords

[No Author keywords available]

Indexed keywords


EID: 21344491824     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619408242538     Document Type: Article
Times cited : (7)

References (17)
  • 17
    • 0003607708 scopus 로고
    • Diffraction and Imaging Techniques in Material Science
    • Edited by: Amelinckx, S., Gevers, R. and Van Landuyt, J. Vol. 1, Amsterdam: North-Holland.
    • Whelan, M. J. 1978. “Diffraction and Imaging Techniques in Material Science”. Edited by: Amelinckx, S., Gevers, R. and Van Landuyt, J. Vol. 1, Amsterdam: North-Holland.
    • (1978)
    • Whelan, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.