Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 12, Issue 2, 1994, Pages 542-547

  Silverman, M P ^b   Qian, W ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b TRINITY COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AS RELATIONSHIPS; COHERENCE PARAMETERS; CONVENTIONAL TEM; FIELD-EMISSION ELECTRONS; IMAGE MAGNIFICATION; INSTRUMENTAL RESOLUTION; QUANTUM MECHANICAL; TRANSVERSE COHERENCE;

QUANTUM THEORY; TRANSMISSION ELECTRON MICROSCOPY;

LUMINANCE;

EID: 21344485832     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.579166     Document Type: Article

References (22)

1. H. Boersch, Phys. Z. 44, 202 (1943).
2. J. Hillier and E. G. Ramberg, J. Appl. Phys. 18, 48 (1947).
3. M. E. Haine and T. Mulvey, J. Sci. In strum. 31, 326 (1954).
4. K. Fukushima, H. Kawakatsu, and A. Fukami, J. Phys. D: Appl. Phys. 7, 257 (1974).
5. J. C. H. Spence, Experimental High Resolution Electron Microscopy, 2nd ed. (Oxford University Press, New York, 1988), p. 279.
6. W. Qian, J. Spence, and J. M. Zuo, Acta. Cryst. A 49, 436 (1993).
7. H. Kreuzer, K. Nakamura, A. Wierzbicki, H. Fink, and H. Schmid, Ultramicroscopy 45, 381 (1992).
8. A. Wilson, A. Sparge, and D. Smith, Optik 61, 63 (1982).
9. G. A. Morton and E. G. Ramberg, Phys. Rev. 56 705 (1939)
10. A. J. Melmed and J. Smit, J. Phys. E 12, 355 (1979).
11. H. W. Fink, H. Schmid, H. J. Kreuzer, and A. Wierzbicki, Phys. Rev. Lett. 67, 1543 (1991).
12. J. C. H. Spence, W. Qian, and A. J. Melmed, Ultramicroscopy 52, 473 (1993).
13. M. R. Scheinfein, W. Qian, and J. C. H. Spence, J. Appl. Phys. 73, 2057 (1993).
14. J. Spence, Optik 92, 57 (1992).
15. J. Spence and J. M. Cowley, Optik 50, 129 (1978).
16. J. C. H. Spence and W. Qian, Phys. Rev. B 45, 10 271 (1992).
17. V. T. Binh, S. Purcell, N. Garcia, and J. Doglioni, Phys. Rev. Lett. 69, 2527 (1992).
18. P. Hawkes and E. Kasper, Electron Optics (Academic, New York, 1989), Vol. 2, p. 971.
19. H. Shimoyama and S. Maruse, Ultramicroscopy 15, 239 (1984).
20. M. P. Silverman II Nuovo Cimento B 97, 200 (1987).
21. E. Zeitler, Scan. Electron Microsc. 671 (1975).
22. W. Qian, M. Scheinfein, and J. C. H. Spence, J. Appl. Phys. 73, 7041 (1993)