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Volumn 69, Issue 1, 1994, Pages 91-103

Transmission electron microscopy of nanomachined silicon crystals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 21344480737     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619408242212     Document Type: Article
Times cited : (77)

References (20)
  • 2
    • 0009181855 scopus 로고
    • Cahn, R. W. 1992. Nature, 357: 645
    • (1992) Nature , vol.357 , pp. 645
    • Cahn, R.W.1
  • 3
    • 84912876633 scopus 로고
    • Cranfield Institute of Technology.
    • Chao, C. L. 1991. Ph.D. Thesis, Cranfield Institute of Technology.
    • (1991) Ph.D. Thesis
    • Chao, C.L.1
  • 8
    • 84953616824 scopus 로고
    • EMIS Datareviews Series No. 1
    • second edition Hitchin, Hertfordshire: INSPEC, Institution of Electrical Engineers.
    • Jeynes, C. 1989. “EMIS Datareviews Series No. 1”. In Properties of Amorphous Silicon, second edition Hitchin, Hertfordshire: INSPEC, Institution of Electrical Engineers.
    • (1989) Properties of Amorphous Silicon
    • Jeynes, C.1
  • 20
    • 84953616826 scopus 로고    scopus 로고
    • Principles of Cutting Mechanics
    • Raleigh, North Carolina: American Society for Precision Engineering.
    • Voter, A. F. and Kress, J. D. Principles of Cutting Mechanics. ASPE Spring Topical Meeting, Tuscon, Arizona. pp.34Raleigh, North Carolina: American Society for Precision Engineering.
    • ASPE Spring Topical Meeting, Tuscon, Arizona , pp. 34
    • Voter, A.F.1    Kress, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.