Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 12, Issue 4, 1994, Pages 2581-2585

  Karain, W I ^a   Knight, L V ^a   Allred, David D ^a   Reves Mena, A ^b  

^a BRIGHAM YOUNG UNIVERSITY   (United States)

^b MOXTEK INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21344477778     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.579061     Document Type: Conference Paper

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