Non contact atomic force microscope electrical manipulation of carbon nanotubes and its application to fabrication of a room temperature operating single electron transistor

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 4 A, 2005, Pages 2056-2060

  Hyon, Chan Kyeong ^a,b   Kojima, Atsuhiko ^a,b   Kamimura, Takafumi ^a,b,c   Maeda, Masatoshi ^b,d   Matsumoto, Kazuhiko ^a,b,c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Atomic force microscope; Carbon nanotubes; Single electron transistors

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRODES; PERMITTIVITY; TRANSISTORS;

COULOMB OSCILLATION; NEGATIVE BIAS; NICKING VOLTAGE; SINGLE ELECTRON TRANSISTORS (SET);

CARBON NANOTUBES;

EID: 21244489615     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.2056     Document Type: Article

References (19)

1. M. S. Dresselhaus, G. Dresselhaus and P. Avouris: Carbon Nanotubes: Synthesis, Structure, Properties, and Applications (Springer, Berlin, 2001).
2. R. Saito, G. Dresselhaus and M. S. Dresselhaus: Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
3. P. Avouris, J. Appenzeller, R. Martel and S. J. Wind: Proc. IEEE 91 (2003) 1772.
4. W. B. Choi, D. S. Chung, J. H. Kang, H. Y. Kim, Y. W. Jin, I. T. Han, Y. H. Lee, J. E. Jung, N. S. Lee, G. S. Park and J. M. Kim: Appl. Phys. Lett. 75 (1999) 3129.
5. J. Kong, N. Franklin, C. Chou, S. Pan, K. J. Cho and H. Dai: Science 287 (2000) 622.
6. P. Kim and C. M. Lieber: Science 286 (1999) 2148.
7. P. Poncharal, Z. L. Wang, D. Ugarte and W. A. de Heer: Science 283 (1999) 1513.
8. T. W. Odom, J. L.Huang, P. Kim and C. M. Lieber: J. Phys. Chem. B 104 (2000) 2794.
9. J. W. G. Wildöer, L. C. Venema, A. G. Rinzler, R. E. Smalley and C. Dekker: Nature 391 (1998) 59.
10. L. C. Venema, J. W. G. Wildöer, H. L. J. Temminck Tuinstra and C. Dekker: Appl. Phys. Lett. 71 (1997) 2629.
11. T. Hertel, R. Martel and P. Avouris: J. Phys. Chem. B 102 (1998) 910.
12. H. W. Ch. Postma, T. Teepen, Z. Yao, M. Grifoni and C. Dekker: Science 293 (2001) 76.
13. D. H. Kim, J. Y. Koo and J. J. Kim: Phys. Rev. B 68 (2003) 113406.
14. J. Y. Park, Y. Yaish, M. Brink, S. Rosenblatt and P. L. McEuen: Appl. Phys. Lett. 80 (2002) 4446.
15. P. L. McEuen, M. S. Fuhrer and H. K. Park: Trans. Nanotechnol. IEEE 1 (2002) 78.
16. A. Bachtold, M. S. Fuhrer, S. Plyasunov, M. Forero, Erik H. Anderson, A. Zettl and P. L. McEuen: Phys. Rev. Lett. 84 (2000) 6082.
17. J. Nygard, D. H. Cobden, M. Bockrath, P. L. McEuen and P. E. Lindelof: Appl. Phys. A 69 (1999) 297.
18. L. Kouwenhoven, C. M. Marcus, P. L. McEuen, S. Tarucha, R. M. Westervelt and N. S. Wingreen: Mesoscopic Electron Transport, eds. L. Kouwenhoven, G. Schön and L. L. Sohn (Kluwer, Dordrecht, The Netherlands, 1997).
19. B. Babic, M. Iqbal and C. Schonenberger: Nanotechnology 14 (2003) 327.