Fragile structured layers on surfaces detected by dynamic atomic force microscopy in aqueous electrolyte solutions

Advanced Powder Technology

Volumn 16, Issue 3, 2005, Pages 213-229

  Li, Ying ^a   Kanda, Yoichi ^a   Shinto, Hiroyuki ^a   Higashitani, Ko ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Adhesive force; Atomic force microscopy; Fragile structured layers

Indexed keywords

ADHESIVES; ADSORPTION; ATOMIC FORCE MICROSCOPY; HYDRATION; SODIUM CHLORIDE; SOLUTIONS;

ADHESIVE FORCES; FRAGILE STRUCTURED LAYERS; SOLID SURFACES; SURFACE FORCE APPARATUS (SFA);

SURFACE PHENOMENA;

EID: 21244472718     PISSN: 09218831     EISSN: None     Source Type: Journal    
DOI: 10.1163/1568552053750206     Document Type: Article

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