Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)

Angewandte Chemie International Edition in English

Volumn 33, Issue 10, 1994, Pages 1023-1043

  Benninghoven, Alfred ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Mass spectrometry; Surface analysis

Indexed keywords

EID: 21244462514     PISSN: 05700833     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.199410231     Document Type: Review

References (58)

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2. Secondary ion mass spectrometery: A new analytical technique for biologically important compounds
3. Simultaneous SIMS, ElD, and Flash-Filament Investigations of the Interaction of Gases with a Tungsten Surface
4. High mass resolution surface imaging with a time-of-flight secondary ion mass spectroscopy scanning microprobe
5. Time-of-flight secondary ion mass spectrometry of insulators with pulsed charge compensation by low-energy electrons
6. Experimental study of the response of a liquid metal field ion source to short HV-extraction pulses
7. Fast atom bombardment mass spectrometry
8. Analysis of surface contaminants on gallium arsenide and silicon by high-resolution time-of-flight secondary ion mass spectrometry
9. Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment
10. Investigations on the mechanism of secondary ion formation from organic compounds: Amino acids
11. Detection of phenylthiohydantoin derivatives of amino acids by SIMS
12. Quantification of molecular secondary ion mass spectrometry by internal standards
13. Time-of-flight secondary ion mass spectrometry of polymer materials
14. On the mechanism of secondary ion formation from poly(methylmethacrylate) under static secondary ion mass spectrometry conditions
15. Time-of-flight secondary ion mass spectrometry of polymer materials