Scattering of surface electromagnetic waves by Sn nanoparticles

Optics Express

Volumn 13, Issue 11, 2005, Pages 4134-4140

  Sterligov, Valeriy A ^a,b   Kretschmann, Matthias ^c,d  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b UNIVERSITÉ CÔTE D'AZUR   (France)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; ELECTROMAGNETIC WAVE REFLECTION; LIGHT POLARIZATION; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OPTICAL SENSORS; PARTICLE SIZE ANALYSIS; PERMITTIVITY; SURFACE PROPERTIES; TIN;

GAUSSIAN PROTUBERANCE; RAYLEIGH EQUATIONS; SCATTERED LIGHT; SURFACE DEFECTS;

ELECTROMAGNETIC WAVE SCATTERING;

EID: 21244454463     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.004134     Document Type: Article

References (10)

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