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Volumn 379, Issue 2, 2004, Pages 312-317
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Compact program resolves overlapping voltammetric peaks
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Author keywords
Curve fitting; Electroanalytical chemistry; Overlapping peaks; Resolve peaks; Simplex method
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Indexed keywords
ALGORITHMS;
CURVE FITTING;
DATA REDUCTION;
NEURAL NETWORKS;
OPTIMIZATION;
PRINCIPAL COMPONENT ANALYSIS;
PROBLEM SOLVING;
ELECTROANALYTICAL CHEMISTRY;
OVERLAPPING PEAKS;
RESOLVE PEAKS;
SIMPLEX METHODS;
ELECTROCHEMISTRY;
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EID: 21144457816
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-004-2550-0 Document Type: Conference Paper |
Times cited : (3)
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References (21)
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