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Volumn 16, Issue 8, 2005, Pages 1119-1122
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Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITORS;
CHARACTERIZATION;
DIELECTRIC MATERIALS;
ELECTRIC CHARGE;
ELECTRIC DISCHARGES;
EMBEDDED SYSTEMS;
GATES (TRANSISTOR);
MULTICARRIER MODULATION;
NANOSTRUCTURED MATERIALS;
DISCHARGING;
GATE DIELECTRIC;
NANOCRYSTALS;
RANDOM CAPACITANCE;
SILICON;
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EID: 21144456454
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/8/022 Document Type: Article |
Times cited : (8)
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References (13)
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