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Volumn 16, Issue 8, 2005, Pages 1119-1122

Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; CHARACTERIZATION; DIELECTRIC MATERIALS; ELECTRIC CHARGE; ELECTRIC DISCHARGES; EMBEDDED SYSTEMS; GATES (TRANSISTOR); MULTICARRIER MODULATION; NANOSTRUCTURED MATERIALS;

EID: 21144456454     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/8/022     Document Type: Article
Times cited : (8)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.