Crystal structure of ethylenediaminesilver(I) 4-nitrobenzoate hemi-hydrate, Ag(C2H8N2)(C7H4NO 4) · 0.5H2O

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 218, Issue 2, 2003, Pages 243-244

  Zhu, H L ^a   Wang, X J ^a   Sun, X J ^a   Wang, D Q ^b  

^a Wuhan Institute of Science and Technology   (China)

^b LIAOCHENG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21144453929     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.2003.218.2.243     Document Type: Article

References (2)

1. Sheldrick, G. M.: Siemens SHELXTL (Version 5.0), Siemens Industrial Automation, Inc., Analytical Instrumentation, USA 1995.
2. Sheldrick, G. M.: SHELXTL-pIus. Release 4.1. Siemens Analytial X-ray Instruments Inc., Madison Wisconsin, USA 1991.