Reliability and modeling of systems integrated with firmware and hardware

International Journal of Reliability, Quality and Safety Engineering

Volumn 12, Issue 3, 2005, Pages 227-239

  Zhang, Tieling ^a   Xie, Min ^a   Tang, Loon Ching ^a   Ng, Szu Hui ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Bathtub shaped failure rate; Firmware reliability; IEC 61508; Reliability modeling

Indexed keywords

COMPUTER OPERATING SYSTEMS; COMPUTER SIMULATION; COMPUTER SOFTWARE; COMPUTER SYSTEM RECOVERY; EMBEDDED SYSTEMS; HARDWARE; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; RELIABILITY THEORY; WEIBULL DISTRIBUTION;

BATHTUB-SHAPED FAILURE RATE; FIRMWARE RELIABILITY; IEC 61508; RELIABILITY MODELING; SAFETY INTEGRITY LEVELS; WEIBULL-EXTENSION MODELS;

FIRMWARE;

EID: 21144453108     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021853930500180X     Document Type: Conference Paper

References (20)

1. M. Xie, Software Reliability Modeling (World Scientific, Singapore, 1991).
2. M. R. Lyu, Handbook of Software Reliability Engineering (McGraw-Hill, New York, 1996).
3. H. Pham, Software Reliability (Springer, Singapore, 2000).
4. C. D. Lai, M. Xie and D. N. P. Murthy, Bathtub-shaped failure rate life distributions, in Handbook of Statistics 20 - Advances in Reliability, eds. N. Balakrishnan and C. R. Rao, Elsevier, New York (2001), pp. 69-104.
5. G. S. Mudholkar and D. K. Srivastava, Exponentiated Weibull family for analyzing bathtub failure-rate data, IEEE Transactions on Reliability 42 (1993) 299-302.
6. G. S. Mudholkar, D. K. Srivastava and M. Freimer, Exponentiated Weibull family: A re-analysis of the bus-motor-failure data, Technometrics 37 (1995) 436-445.
7. C. D. Lai, M. Xie and D. N. P. Murthy, A modified Weibull distribution, IEEE Transactions on Reliability 52 (2003) 33-37.
8. M. Xie, Y. Tang and T. N. Goh, A modified Weibull extension with bathtub-shaped failure rate function, Reliability Engineering and System Safety 76 (2002) 279-285.
9. A. W. Marshall, I. Olkin, A new method for adding a parameter to a family of distributions with application to the exponential and Weibull families, Biometrika 84 (1997) 641-652.
10. E. Haupt and H. Schäbe, A new model for a lifetime distribution with bathtub shaped failure rate, Microelectronics and Reliability 32 (1992) 633-639.
11. H. Schäbe, Constructing lifetime distributions with bathtub shaped failure rate from DFR distributions, Microelectronics and Reliability 34 (1994) 1501-1508.
12. http://www.its.bldrdoc.gov/fs-1037/dir-015/_2236.htm (1996).
13. S. Kumar and K. Li, Performance impact of using ESP to implement VMMC firmware, Workshop on Novel Users of System Area Networks (SAN-1) (2002).
14. http://www.cpsc.gov/library/data.html.
15. M. Hecht, The role of safety analyses in reducing products liability exposure in 'Smart' consumer products containing software and firmware, in Proc. Annual Symp. Reliability and Maintainability (2003), pp. 153-158.
16. R. Jiang and D. N. P. Murthy, The exponentiated Weibull family: A graphical approach, IEEE Transactions on Reliability 48 (1999) 68-72.
17. D. R. Wingo, Parametric point estimation for a double-truncated Weibull distribution, Microelectronics and Reliability 28 (1988) 613-617.
18. M. M. Mittal and R. C. Dahiya, Estimating the parameters of a truncated Weibull distribution, Communications in Statistics - Theory & Methods 18 (1989) 2027-2041.
19. ANSI/ISA-SP-84.01, Application of safety instrumented systems for the process industries, in Instrument Society of America Standards and Practices (1996).
20. IEC 61508, Functional safety of electric/electronic/programmable electronic safety-related systems, Parts 1-7; October 1998-May 2000.