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Volumn 38, Issue 6, 2005, Pages 1199-1208

Monte Carlo simulations of the smeared phase transition in a contact process with extended defects

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[No Author keywords available]

Indexed keywords


EID: 21144451078     PISSN: 03054470     EISSN: None     Source Type: Journal    
DOI: 10.1088/0305-4470/38/6/001     Document Type: Article
Times cited : (19)

References (37)
  • 27
    • 24144460427 scopus 로고    scopus 로고
    • Hooyberghs J, Igloi F and Vanderzande C 2004 Preprint cond-mat/0402086
    • Hooyberghs J, Igloi F and Vanderzande C 2004 Preprint cond-mat/0402086


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.