Reflectance difference spectroscopy - A powerful tool to study adsorption and growth

Applied Physics A: Materials Science and Processing

Volumn 80, Issue 5, 2005, Pages 1005-1010

  Hohage, M ^a   Sun, L D ^a   Zeppenfeld, P ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ANISOTROPY; AUGER ELECTRON SPECTROSCOPY; COPPER COMPOUNDS; FILM GROWTH; LIGHT POLARIZATION; LOW ENERGY ELECTRON DIFFRACTION; REFLECTION; SCANNING TUNNELING MICROSCOPY; SECOND HARMONIC GENERATION; THIN FILMS;

OPTICAL ANISOTROPY; PHOTOELASTIC MODULATORS; REFLECTANCE DIFFERENCE SPECTROSCOPY (RDS); SUM FREQUENCY GENERATION (SFG);

SPECTROSCOPIC ANALYSIS;

EID: 21144445860     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-3128-6     Document Type: Article

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