Point-contact spectroscopy of the relaxation dynamics of two-level systems upon structural changes in Ni-Nb glasses

Low Temperature Physics

Volumn 29, Issue 2, 2003, Pages 123-129

  Balkashin, O P ^a   Yanson, I K ^a   Halbritter, A ^b   Mihaly G ^b  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ALLOYS; BINARY ALLOYS; CURRENT VOLTAGE CHARACTERISTICS; DISPERSIONS; GLASS; METALLIC GLASS; NICKEL ALLOYS; POINT CONTACTS;

CONDUCTION ELECTRONS; FREQUENCY DISPERSION; HIGH-TEMPERATURE ANNEALING; POINT CONTACT SPECTRA; POINT CONTACT SPECTROSCOPY; RELAXATION DYNAMICS; RELAXATION FREQUENCY; SECOND DERIVATIVES;

NIOBIUM ALLOYS;

EID: 21144443600     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542411     Document Type: Article

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