Spectral methods for lifetime prediction under wide-band stationary random processes

International Journal of Fatigue

Volumn 27, Issue 8, 2005, Pages 867-877

  Benasciutti, D ^a   Tovo, R ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Fatigue damage; Power spectral density; Wide band stochastic process

Indexed keywords

CORRELATION METHODS; CRACK PROPAGATION; CYCLIC LOADS; FATIGUE OF MATERIALS; FOURIER TRANSFORMS; FUNCTIONS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; STRESS ANALYSIS;

FATIGUE DAMAGE; POWER SPECTRAL DENSITY; STATIONARY RANDOM PROCESSES; WIDE-BAND STOCHASTIC PROCESS;

RANDOM PROCESSES;

EID: 21144440768     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2004.10.007     Document Type: Conference Paper

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