Optimal burn-in procedures in A generalized environment

International Journal of Reliability, Quality and Safety Engineering

Volumn 12, Issue 3, 2005, Pages 189-201

  Cha, Ji Hwan ^a   Mi, Jie ^b  

^a Pukyong National University   (South Korea)

^b FLORIDA INTERNATIONAL UNIVERSITY   (United States)

Author keywords

Bathtub shaped failure rate; Change points; Eventually increasing failure rate; Infancy points; Initially decreasing failure rate; Wear out points

Indexed keywords

DATA ACQUISITION; ELECTRONIC EQUIPMENT; FAILURE ANALYSIS; FUNCTIONS; INTEGRATED CIRCUITS; PROBABILITY DENSITY FUNCTION; RELIABILITY; SILICON;

BATHTUB-SHAPED FAILURE RATE; BURN-IN METHOD; CHANGE POINTS; CUMULATIVE DISTRIBUTION FUNCTION; EVENTUALLY INCREASING FAILURE RATE; INFANCY POINTS; INITIALLY DECREASING FAILURE RATE; SURVIVOR FUNCTION; WEAR-OUT POINTS;

INITIAL VALUE PROBLEMS;

EID: 21144437552     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021853930500177X     Document Type: Conference Paper

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