Image processing of 2D resistivity data for imaging faults

Journal of Applied Geophysics

Volumn 57, Issue 4, 2005, Pages 260-277

  Nguyen, F ^a,d   Garambois, Stephane ^b   Jongmans, Denis ^b   Pirard, E ^a   Loke, M H ^c  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b UNIV GRENOBLE ALPES   (France)

^c SCHOOL OF PHYSICS   (Malaysia)

^d Chemin des Chevreuils ^*  (Belgium)

Author keywords

Active faults; Electrical tomography; Fault survey; Image processing; Near surface geophysics

Indexed keywords

DATA ACQUISITION; GEOGRAPHICAL REGIONS; GEOLOGICAL SURVEYS; IMAGING TECHNIQUES; STRUCTURAL ANALYSIS; TOMOGRAPHY; TWO DIMENSIONAL;

DATA SET; GEOLOGICAL BODIES; GRADIENT IMAGES; SYNTHETIC MODELS;

IMAGE PROCESSING;

ACTIVE FAULT; ELECTRICAL RESISTIVITY; IMAGE PROCESSING;

EID: 21044459986     PISSN: 09269851     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jappgeo.2005.02.001     Document Type: Article

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