Time-of-flight diffraction with multiple frame overlap Part II: The strain scanner POLDI at PSI

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 545, Issue 1-2, 2005, Pages 330-338

  Stuhr, U ^a   Spitzer, H ^a   Egger, J ^a   Hofer, A ^a   Rasmussen, P ^a   Graf, D ^a   Bollhalder, A ^a   Schild, M ^a   Bauer, G ^a   Wagner, W ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Residual stress; Strain scanner; Time of flight diffractometer

Indexed keywords

BOUNDARY CONDITIONS; INDUSTRIAL APPLICATIONS; NEUTRON DIFFRACTION; NEUTRON SCATTERING; NUCLEAR REACTORS; RADIOACTIVE MATERIALS; RESIDUAL STRESSES;

NEUTRON FLUX; PULSE-OVERLAP DIFFRACTOMETER (POLDI); STRAIN SCANNER; TIME-OF-FLIGHT DIFFRACTOMETER;

DIFFRACTOMETERS;

EID: 21044456169     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.01.321     Document Type: Article

References (2)

1. U. Stuhr, Nucl. Instr. and Meth. A, this issue, doi:10.1016/j.nima.2005. 01.320.
2. J.M. Carpenter Nucl. Instr. and Meth. 47 1967 179