메뉴 건너뛰기




Volumn 49, Issue 2-3, 2005, Pages 289-301

Blue Gene/L compute chip: Control, test, and bring-up infrastructure

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER DEBUGGING; CONTROL EQUIPMENT; EMBEDDED SYSTEMS; INTERFACES (COMPUTER); LOGIC CIRCUITS; PARALLEL PROCESSING SYSTEMS; SERVERS; STATIC RANDOM ACCESS STORAGE; SUPERCOMPUTERS;

EID: 21044452860     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.492.0289     Document Type: Article
Times cited : (13)

References (19)
  • 2
    • 0003415191 scopus 로고
    • "IEEE Standard Test Access Port and Boundary-Scan Architecture"
    • IEEE Standard 1149.la-1993, IEEE, New York, October ISBN: 1559373504
    • IEEE Standard 1149.la-1993, "IEEE Standard Test Access Port and Boundary-Scan Architecture," IEEE, New York, October 1993. ISBN: 1559373504.
    • (1993)
  • 3
    • 19344372182 scopus 로고    scopus 로고
    • "Multi-Core Chip Providing External Core Access with Regular Operation Function Interface and Predetermined Service Operation Services Interface Comprising Core Interface Units and Masters Interface Unit"
    • February
    • S. M. Douskey, M. C. Cogswell, G. R. Currier, J. R. Elliott, S. D. Vincent, J. M. Wallin, and P. L. Wiltgen, "Multi-Core Chip Providing External Core Access with Regular Operation Function Interface and Predetermined Service Operation Services Interface Comprising Core Interface Units and Masters Interface Unit," U.S. Patent 6,115,763, February 2000.
    • (2000) U.S. Patent 6,115,763
    • Douskey, S.M.1    Cogswell, M.C.2    Currier, G.R.3    Elliott, J.R.4    Vincent, S.D.5    Wallin, J.M.6    Wiltgen, P.L.7
  • 4
    • 19344369894 scopus 로고    scopus 로고
    • See
    • See http://www.ibm.com/chips/products/powerpc/tools/riscwatc.html.
  • 5
    • 19344376298 scopus 로고    scopus 로고
    • IBM Corporation, IBM ASIC Application Note SA2282-04: IEEE 1149.1 Boundary Scan in IBM ASICS
    • IBM Corporation, IBM ASIC Application Note SA2282-04: IEEE 1149.1 Boundary Scan in IBM ASICS, 2004.
    • (2004)
  • 7
    • 19344378427 scopus 로고    scopus 로고
    • Electronic Industries Association (EIA)/JEDEC Standard EIA/JESD8-6. See
    • Electronic Industries Association (EIA)/JEDEC Standard EIA/JESD8-6. See http://www.jedec.org/download/search/jesd8-6.pdf.
  • 8
    • 19344373161 scopus 로고    scopus 로고
    • "Reconciliation Sublayer (RS) and Gigabit Media Independent Interface (GMII)"
    • IEEE Standard 802.3, clause 35, IEEE, Piscataway, NJ, See
    • IEEE Standard 802.3, clause 35, "Reconciliation Sublayer (RS) and Gigabit Media Independent Interface (GMII)," IEEE, Piscataway, NJ, 2000. See http://www.ieee.org.
    • (2000)
  • 10
    • 0030196870 scopus 로고    scopus 로고
    • "Test Methodologies and Design Automation for IBM ASICs"
    • P. S. Gillis, T. S. Guzowski, B. L. Keller, and R. H. Kerr, "Test Methodologies and Design Automation for IBM ASICs," IBM J. Res. & Dev. 40, No. 4, 461-474 (1996).
    • (1996) IBM J. Res. & Dev. , vol.40 , Issue.4 , pp. 461-474
    • Gillis, P.S.1    Guzowski, T.S.2    Keller, B.L.3    Kerr, R.H.4
  • 12
    • 0025404497 scopus 로고
    • "Built-In Self-Test Support in the IBM Engineering Design System"
    • B. L. Keller and T. J. Snethen, "Built-In Self-Test Support in the IBM Engineering Design System," IBM J. Res. & Dev. 34, No. 2/3, 406-415 (1990).
    • (1990) IBM J. Res. & Dev. , vol.34 , Issue.2-3 , pp. 406-415
    • Keller, B.L.1    Snethen, T.J.2
  • 13
    • 19344370379 scopus 로고    scopus 로고
    • See
    • See http://www.cadence.com/products/digital_ic/encountertest/ index.aspx.
  • 18
    • 19344365621 scopus 로고    scopus 로고
    • "Compilable Address Magnitude Comparator for Memory Array Self-Testing"
    • December
    • C. Chai, J. H. Fischer, M. R. Ouellette, and M. H. Wood, "Compilable Address Magnitude Comparator for Memory Array Self-Testing," U.S. Patent 6,658,610, December 2003.
    • (2003) U.S. Patent 6,658,610
    • Chai, C.1    Fischer, J.H.2    Ouellette, M.R.3    Wood, M.H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.