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Volumn 379, Issue 4, 2004, Pages 605-609

Characterization of the distribution of the sintering activator boron in powder metallurgical steels with SIMS

Author keywords

Activator; Boron; PM; SIMS; Sintering

Indexed keywords

ARGON; BORON; CHEMICAL ACTIVATION; EUTECTICS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HYDROGEN; MICROSTRUCTURE; NITROGEN; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SINTERING; STEEL;

EID: 21044446118     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-004-2537-x     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 5
    • 18244388381 scopus 로고    scopus 로고
    • Dynamic secondary ion mass spectrometry
    • Bubert H, Jenett H (eds). Wiley-VCH, Weinheim, Germany
    • Hutter H (2002) Dynamic secondary ion mass spectrometry. In: Bubert H, Jenett H (eds) Surface and thin film analysis. Wiley-VCH, Weinheim, Germany, pp 106-121
    • (2002) Surface and Thin Film Analysis , pp. 106-121
    • Hutter, H.1
  • 8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.