In situ X-ray Rietveld analysis of Ni-YSZ solid oxide fuel cell anodes during NiO reduction in H2

Journal of Physics D: Applied Physics

Volumn 38, Issue 13, 2005, Pages 2276-2282

  Rojas, A Reyes ^a,b   Esparza Ponce, H E ^a   Fuentes, L ^a   Lopez Ortiz A ^a   Keer, A ^a   Reyes Gasga, J ^c  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

^b UNIVERSIDAD AUTÓNOMA DEL ESTADO DE MÉXICO   (Mexico)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CHARACTERIZATION; ENERGY DISPERSIVE SPECTROSCOPY; HYDROGEN; NICKEL COMPOUNDS; PHASE COMPOSITION; PHASE TRANSITIONS; REACTION KINETICS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SINTERING; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

ANODE CRACKING; CELL VOLUME; PRECURSORS; RIETVELD ANALYSIS;

SOLID OXIDE FUEL CELLS;

EID: 21044446097     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/13/029     Document Type: Article

References (28)

1. Carrillo A S, Tagawa T and Goto S 2001 Mater. Res. Bull. 36 1017-27
2. Yoona S P, Hana J, Nama S W, Lima T H, Oha I H, Honga S A, Yoob Y S and Limb H C 2002 J. Power Sources 106 160-6
3. Lu Z, Pei L, He T M, Huang X G, Liu Z G, Yuan Ji Y and Su W H 2002 J. Alloys Compounds 334 299-303
4. Dongare M K, Dongare A M, Tare V B and Kemnitz E 2002 Solid State Ion. 152-153 455-62
5. Jang W S and Hyun S H 2002 J. Mater. Sci. 37 2535-41
6. Kim J H, Song R H, Song K S, Hyun S H, Shin D R and Yokokawa H 2003 J. Power Sources 122 138-43
7. Ko J H, Yoo Y S, Park J and Lim H C 2002 Solid State Ion. 149 157-66
8. Fuku T and Ohara S 2001 Japan. J. Chem. Eng. 34 964-6
9. Singhal S C 2002 Solid State Ion. 152-153 405-10
10. Jiang S P and Ramprakash Y 1999 Solid State Ion. 122 211-22
11. Rodriguez J A, Hanson J C, Frenkel A I, Kim J Y and Perez M 2002 J. Am. Chem. Soc. 124 346-51
12. Fouquet D, Muller A C, Weber A and Ivers Tiffee E I 2002 Proc. European Solid Oxide Fuel Cell Forum pp 467-74
13. Lee J H, Moon H, Lee H W, Kim J, Kim D D and Yoon K H 2002 Solid State Ion. 148 15-26
14. Chung D D L 1993 X-Ray Diffraction at Elevated Temperatures: A Method For In-situ Process Analysis (New York: VCH) pp 237-49
15. Young R A (ed) 1993 The Rietveld Method School of Physics, Georgia Institute of Technology, Atlanta
16. Rodriguez-Carvajal J 1998 Program Fullprof 98 version 0.2, Laboratorie Leon Brillouin (CEA-CNRS)
17. National Institute of Standards and Technology 1989 Standard Reference Material 674a, Department of Commerce, United States of America
18. Gualtieri A F 2000 J. Appl. Crystall. 33 267-78
19. JCPDS International Centre for Diffraction Data Copyright (C) JCPDS-ICDD 2000, card 04-0835
20. JCPDS International Centre for Diffraction Data Copyright (C) JCPDS-ICDD 2000, card 30-1468
21. JCPDS International Centre for Diffraction Data Copyright (C) JCPDS-ICDD 2000, card 04-0850
22. JCPDS International Centre for Diffraction Data Copyright (C) JCPDS-ICDD 2000, card 42-1164
23. Inorganic Crystal Structure Database ICSD version 2004-1 (atomic positions)
24. International Tables for Crystallography 1996
25. Yousuf M, Sahu P C, Jajoo H K, Rajagopalan S and Govinda Rajan K 1986 J. Phys. F. Met. Phys. 16 373-80
26. Swanson H E and Tatge E 1967 Acta Crystallogr. 1 1948-23
27. Swanson H E and Tatge E 1954 Acta Crystallogr. 7 464
28. Levenspiel O 1999 Chemical Reaction Engineering 3rd edn (New York: Wiley)