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Volumn 545, Issue 1-2, 2005, Pages 252-260

Radiation monitoring in Mrad range using radiation-sensing field-effect transistors

Author keywords

Annealing; B factory; Radiation monitoring; Silicon detectors

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC PROPERTIES; PHOTONS; RADIATION DETECTORS; SILICON; THRESHOLD VOLTAGE;

EID: 21044434020     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.01.347     Document Type: Article
Times cited : (17)

References (11)
  • 7
    • 0342827011 scopus 로고    scopus 로고
    • REM's integrating dosimeter system based on the RadFET
    • REM Oxford Ltd.
    • A. Holmes-Siedle, REM's Integrating Dosimeter System Based on the RadFET, REM-TR 98-3, REM Oxford Ltd., 1999.
    • (1999) REM-TR , vol.98 , Issue.3
    • Holmes-Siedle, A.1
  • 8
    • 0033314602 scopus 로고    scopus 로고
    • A system for radiation damage monitoring
    • A.B. Rosenfeld A system for radiation damage monitoring IEEE Trans. Nucl. Sci. NS-46 1999 6
    • (1999) IEEE Trans. Nucl. Sci. , vol.NS-46 , pp. 6
    • Rosenfeld, A.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.