|
Volumn 545, Issue 1-2, 2005, Pages 252-260
|
Radiation monitoring in Mrad range using radiation-sensing field-effect transistors
|
Author keywords
Annealing; B factory; Radiation monitoring; Silicon detectors
|
Indexed keywords
ANNEALING;
DEPOSITION;
ELECTRIC PROPERTIES;
PHOTONS;
RADIATION DETECTORS;
SILICON;
THRESHOLD VOLTAGE;
B FACTORY;
RADIATION MONITORING;
RADIATION-SENSING;
SILICON DETECTORS;
FIELD EFFECT TRANSISTORS;
|
EID: 21044434020
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2005.01.347 Document Type: Article |
Times cited : (17)
|
References (11)
|