Risks of damage to electronics with reference to charged clothing

Journal of Electrostatics

Volumn 63, Issue 6-10, 2005, Pages 603-608

  Paasi, Jaakko ^a   Fast, L ^b   Kalliohaka, T ^a   Smallwood, J ^c   Borjesson A ^d   Haase, J ^e   Vogel, C ^e   Lemaire, P ^f   Coletti, G ^g   Guastavino, F ^g   Peltoniemi, T ^h   Reina, G ⁱ  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^b SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

^c Electrostatic Solutions Ltd   (United Kingdom)

^d Agb konsult   (Sweden)

^e Sachsisches Textilforschungsinstitut   (Germany)

^f Centexbel ^*  (Belgium)

^g UNIVERSITY OF GENOA   (Italy)

^h NOKIA RESEARCH CENTER   (United States)

ⁱ Celestica Italia   (Italy)

Author keywords

Electrostatic discharge; ESD protective clothing; ESD sensitive devices

Indexed keywords

CHARGE TRANSFER; ELECTRIC DISCHARGES; ELECTRIC INDUCTORS; ELECTRONIC EQUIPMENT; FAILURE ANALYSIS; PROTECTIVE CLOTHING; RISK MANAGEMENT;

CHARGED CLOTHING; DEVICE FAILURES; ELECTROSTATIC DISCHARGES (ESD); PEAK CURRENTS;

FABRICS;

ELECTROSTATICS;

EID: 20944443286     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2005.03.023     Document Type: Article

References (7)

1. J. Paasi, et al., Electrostatic testing of ESD-protective clothing for electronics industry, Inst. Phys. Conf. Ser., vol. 178, 2004, pp. 239-246.
2. M.J. Dyer, The antistatic performance of cleanroom clothing: Do tests on the fabric relate to the performance of cleanroom clothing, in: Proceedings of the EOS/ESD Symposium, vol. EOS-19, 1997, pp. 276-286.
3. G. Baumgartner, Consideration for developing ESD garment specifications, Report ESD TR 05-00, ESDA, New York, 2000.
4. ESD Association Standard ESD STM2.1, 1997.
5. IEC Technical Report 61340-5-1, 1997.
6. L. Fast, J. Paasi, A modified potential probe for induction charging risk assessment, unpublished.
7. J. Paasi, J. Smallwood, H. Salmela, New methods for the assessment of ESD threats to electronic components, in: Proceedings of the EOS/ESD Symposium, vol. EOS-25, 2003, pp. 151-160.