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Volumn 79, Issue , 2004, Pages 759-761
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THz wave near-field emission microscope
a a,b a a,b a |
Author keywords
[No Author keywords available]
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Indexed keywords
METAL;
CONFERENCE PAPER;
LASER;
MEASUREMENT;
NANOPARTICLE;
NEAR FIELD EMISSION MICROSCOPE;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
SEMICONDUCTOR;
SURFACE PROPERTY;
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EID: 20944441299
PISSN: 01726218
EISSN: None
Source Type: Book Series
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (7)
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