Nanoscale imaging of surface acoustic waves by scanning tunneling microscopy

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Koch, R ^a   Yang, Jianshu ^a,b  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAM SIZE; LATERAL SURFACE MOVEMENT; RAYLEIGH WAVES; SURFACE ACOUSTIC WAVES;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELASTIC MODULI; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY; WAVE PROPAGATION;

ACOUSTIC WAVES;

EID: 20944439734     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1903102     Document Type: Article

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