Absolute and relative density measurements in a N 2/ Ar dielectric barrier discharge by diode-laser absorption spectroscopy and resolved plasma emission

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Williamson, James M ^a   Bletzinger, Peter ^a   Ganguly, Biswa N ^b  

^a INNOVATIVE SCIENTIFIC SOLUTIONS INC   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC BARRIER DISCHARGE; OZONE TREATMENT; RELATIVE DENSITY MEASUREMENTS; RESOLVED PLASMA EMISSION;

ABSORPTION SPECTROSCOPY; ATMOSPHERIC PRESSURE; DEPOSITION; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; LIGHT ABSORPTION;

SEMICONDUCTOR LASERS;

EID: 20944438101     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1894585     Document Type: Article

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