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Volumn 8, Issue 2, 1998, Pages 541-543

Investigation of the conductivity through impurities in noncompensated silicon by means of IR-laser spectroscopy

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[No Author keywords available]

Indexed keywords


EID: 20944434334     PISSN: 1054660X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.