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Volumn 8, Issue 2, 1998, Pages 541-543
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Investigation of the conductivity through impurities in noncompensated silicon by means of IR-laser spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 20944434334
PISSN: 1054660X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (8)
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