Adhesive contact modeling for sub-5-nm ultralow flying magnetic storage head-disk interfaces including roughness effects

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Suh, Allison Y ^a   Polycarpou, Andreas A ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE CONTACT MODELLING; HEAD-DISK INTERFACES; PARALLEL SURFACE APPROXIMATIONS; ROUGHNESS EFFECTS;

APPROXIMATION THEORY; ELECTROSTATICS; INTERFACES (MATERIALS); MAGNETIC RECORDING; MAGNETIC STORAGE; SURFACE ROUGHNESS;

ADHESIVES;

EID: 20944433758     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1914951     Document Type: Article

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