Tunable-optical-filter-based white-light interferometry for sensing

Optics Letters

Volumn 30, Issue 12, 2005, Pages 1452-1454

  Yu, Bing ^a   Wang, Anbo ^a   Pickrell, Gary ^a   Xu, Juncheng ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL COHERENCE TOMOGRAPHY; OPTICAL PATH DIFFERENCES (OPD); TUNABLE OPTICAL FILTERS (TOF); WHITE-LIGHT INTERFEROMETRY (WLI);

BACKSCATTERING; COHERENT LIGHT; FABRY-PEROT INTERFEROMETERS; INTERFEROMETRY; OPTICAL SENSORS; PERTURBATION TECHNIQUES; RAYLEIGH SCATTERING; SIGNAL TO NOISE RATIO;

OPTICAL FILTERS;

EID: 20944432191     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.001452     Document Type: Article

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