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Volumn 86, Issue 19, 2005, Pages 1-3
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Calculation of the linewidth broadening in vertical-cavity surface-emitting lasers due to temperature fluctuations
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Author keywords
[No Author keywords available]
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Indexed keywords
FOURIER TRANSFORMS;
LIGHT EMISSION;
REFRACTIVE INDEX;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR MATERIALS;
THERMAL CONDUCTIVITY;
THERMAL DIFFUSION;
THERMAL EFFECTS;
LASER LINEWIDTH;
TEMPERATURE FLUCTUATIONS;
THERMOREFRACTIVE EFFECT;
VERTICAL-CAVITY SURFACE-EMITTING LASERS (VCSEL);
SOLID STATE LASERS;
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EID: 20844461326
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1924868 Document Type: Article |
Times cited : (10)
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References (14)
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