Field emission characteristics of a tungsten microelectromechanical system device

Applied Physics Letters

Volumn 86, Issue 15, 2005, Pages 1-3

  Cruz, D ^a,b   Chang, J P ^b   Blain, M G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC STACKS; EDGE FIELD EMITTER; PAUL ION TRAP; TRAP SIZE;

ATMOSPHERIC PRESSURE; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC MATERIALS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON TRAPS; FABRICATION; FIELD EMISSION DISPLAYS; SILICA; TUNGSTEN;

MICROELECTROMECHANICAL DEVICES;

EID: 20844458062     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1875756     Document Type: Article

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