Fractal signature methods for profiling of processed surfaces

Technical Physics

Volumn 50, Issue 5, 2005, Pages 560-575

  Potapov, A A ^a   Bulavkin, V V ^b   German, V A ^a   Vyacheslavova, O F ^c  

^a INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

^b Tekhnomash State Unitary Research Enterprise   (Russian Federation)

^c MOSCOW POLYTECHNIC UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 20844446777     PISSN: 10637842     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1927210     Document Type: Article

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