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Volumn 86, Issue 15, 2005, Pages 1-3
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Direct current electrical characterization of ds-DNA in nanogap junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
DNA HYBRIDIZATION;
ELECTRICAL FUSE;
FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM);
MOLECULAR ELECTRONICS;
BIOSENSORS;
CHARACTERIZATION;
CHARGE TRANSFER;
ELECTRIC CONDUCTANCE;
ELECTRIC CONDUCTIVITY;
ELECTRIC VARIABLES MEASUREMENT;
ELECTRODES;
ELECTROMIGRATION;
GOLD;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR JUNCTIONS;
THIN FILMS;
TITANIUM;
DNA;
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EID: 20844445073
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1900315 Document Type: Article |
Times cited : (93)
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References (12)
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