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Volumn 86, Issue 15, 2005, Pages 1-3

Direct current electrical characterization of ds-DNA in nanogap junctions

Author keywords

[No Author keywords available]

Indexed keywords

DNA HYBRIDIZATION; ELECTRICAL FUSE; FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM); MOLECULAR ELECTRONICS;

EID: 20844445073     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1900315     Document Type: Article
Times cited : (93)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.