A device for measuring electrical properties of dielectric materials

Instrumentation Science and Technology

Volumn 33, Issue 3, 2005, Pages 279-287

  Melman, Y ^a   Baltianski, S ^a   Tsur, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Dielectric materials; Impedance spectroscopy; Measurement device; Sample holder

Indexed keywords

CERAMIC MATERIALS; CRYOSTATS; ELECTRIC IMPEDANCE; ELECTRIC PROPERTIES; MEASUREMENT THEORY; NATURAL FREQUENCIES; SPECTROSCOPIC ANALYSIS;

ELECTROCERAMICS; IMPEDENCE SPECTROSCOPY; MEASUREMENT DEVICE; SAMPLE HOLDER;

DIELECTRIC MATERIALS;

EID: 20844437725     PISSN: 10739149     EISSN: None     Source Type: Journal    
DOI: 10.1081/CI-200056096     Document Type: Article

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