Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]

Applied Physics Letters

Volumn 86, Issue 21, 2005, Pages

  Lin, Yow Jon ^a   Gabás, Mercedes ^b   Gota, Susana ^c   Ramos Barrado, Joś Ramón ^b   Sánchez, Miguel ^b   Barrett, Nicholas T ^c   Avila, Joś ^d   Sacchi, Maurizio ^d  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b UNIVERSITY OF MÁLAGA   (Spain)

^c CEA SACLAY   (France)

^d UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

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Indexed keywords

EID: 20844436580     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1935759     Document Type: Note

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