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Volumn 1, Issue , 2004, Pages 391-396

Fault detection in fieldbuses with time domain reflectometry

Author keywords

Fault location; Fieldbus; Pattern recognition; Simulation; Time domain reflectometry

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POWER DISTRIBUTION; IMAGE ANALYSIS; LIGHT REFLECTION; PATTERN RECOGNITION; REFLECTOMETERS; TIME DOMAIN ANALYSIS;

EID: 20744450238     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (28)

References (19)
  • 2
    • 0035068233 scopus 로고    scopus 로고
    • Measurement of soil water content and electrical conductivity by time domain reflectometry: A review
    • Noborio, K.: Measurement of soil water content and electrical conductivity by time domain reflectometry: a review; Computer and Electronics in Agriculture, Vol. 31, pp. 213-237, 2001
    • (2001) Computer and Electronics in Agriculture , vol.31 , pp. 213-237
    • Noborio, K.1
  • 4
    • 20744432395 scopus 로고    scopus 로고
    • Testing methods for detection of insulation damage in aerospace wiring harness
    • Sept. 10-13, Orlando, Florida
    • Hanson, Josef: Testing Methods for Detection of Insulation Damage in Aerospace Wiring Harness; 5th Joint FAA/DoD/NASA Conference on Aging Aircraft, Sept. 10-13, Orlando, Florida, 2001
    • (2001) 5th Joint FAA/DoD/NASA Conference on Aging Aircraft
    • Hanson, J.1
  • 6
    • 0035262867 scopus 로고    scopus 로고
    • Down to the wire: The hidden hazard of aging aircraft wiring
    • Feb.
    • Furse, Cynthia; Haupt, R.: Down to the Wire: The Hidden Hazard of Aging Aircraft Wiring; IEEE Spectrum, Feb. 2001, pp.35-39
    • (2001) IEEE Spectrum , pp. 35-39
    • Furse, C.1    Haupt, R.2
  • 12
    • 20744437348 scopus 로고    scopus 로고
    • Fehlersuche in Automatisierungssystemen mit Feldbus-Vernetzung
    • (ISSN 0932-383X) Springer Verlag Wien 1997
    • Kabitzsch, K.; Hartenstein, D.: Fehlersuche in Automatisierungssystemen mit Feldbus-Vernetzung. e&i Elektrotechnik und Informationstechnik 114(1997) H. 5, S. 274-279, (ISSN 0932-383X) Springer Verlag Wien 1997
    • (1997) E&i Elektrotechnik und Informationstechnik , vol.114 , Issue.5 , pp. 274-279
    • Kabitzsch, K.1    Hartenstein, D.2
  • 16
    • 0000518308 scopus 로고    scopus 로고
    • Simulation of high speed interconnects
    • May
    • Achar, R.; Nakhla, M. S.: Simulation of High Speed Interconnects; Proceedings of the IEEE, Vol. 89, No. 5, May 2001, pp. 693-728
    • (2001) Proceedings of the IEEE , vol.89 , Issue.5 , pp. 693-728
    • Achar, R.1    Nakhla, M.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.