AFM measurement of step kinetics for the growth and dissolution of crystallites

Spectroscopy (Santa Monica)

Volumn 20, Issue 6, 2005, Pages 16-20

  Teng, H Henry ^a  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE METHOD; DEFORMED METAL CRYSTALS; SCREW DISLOCATION; STEP DISPLACMENT METHOD;

DEFECTS; EDGE DETECTION; IMAGING TECHNIQUES; PROBES; TECHNOLOGY TRANSFER; VAN DER WAALS FORCES; VECTORS;

ATOMIC FORCE MICROSCOPY;

EID: 20744447906     PISSN: 08876703     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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